Wireless Test

RFID Tag Static Test

The RF performance of the RFID system is highly sensitive to its operation environments, tag arrangements, reader and tag designs. The associated operations of the RFID static test system in the anechoic chamber can effectively eliminate multipath effects due to environmental clutters.

RFID operation performance in three dimensions can be evaluated within a microwave anechoic chamber environment for antenna testing to reduce various interferences from different environments and possibly to obtain parameterized results of RFID performance due to controllable impacting factors in different operation environments.

 

Contact:

Edward K L CHAN, Ph.D.

Assistant Program Manager

Tel: +852 2358 8814 / 9709 3931

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About the Centre

Shenzhen RFID Center
Shenzhen RFID Center
Hong Kong University of Science and Technology (HKUST)

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HKUST Shenzhen Research Institute, Room 416, HKUST SZ IER Building, No. 9 Yuexing 1st Road, South Area, Hi-tech Park, Nanshan, Shenzhen , China , 518057
2358 8344