Material Test

Transmission Electron Microscope (TEM)

Transmission electron microscopy is an extremely valuable technique for the characterization of materials. It uses high-energy electrons to probe solids down to the atomic scale. High resolution images which reveal local structures, electron diffraction patterns which identify crystal class and lattice parameters and chemical composition of samples can all be collected.

Applications:

- Material Analysis including Metallic Oxides and Alloys

- Defect Analysis

- Life Sciences and Biological Samples

- Nanostructures and Nanotechnology

- Semiconductor Devices

 

Contact:

Mr. Benson Leung

Tel: +852 3411 5876

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About the Centre

Institute of Advanced Materials
Institute of Advanced Materials
Hong Kong Baptist University (HKBU)

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Cha Chi-ming Science Tower, Hong Kong Baptist University, Kowloon Tong , Hong Kong, China
3411 7014