Material Test

Field Emission Scanning Electron Microscope (FESEM)

Scanning electron microscopy (SEM) is one of the most versatile and well known analytical techniques. It offers images with high magnification, large depth of focus, great resolution and ease of sample preparation and observation. In addition, Energy Dispersive X-ray (EDX) Analysis is also widely used for chemical analysis. The characteristic X-rays emitted serve as fingerprints and give qualitative and quantitative elemental information of the samples.

 

Applications:

- Nanomaterials/Nanostructures

- Biological/Life Science Samples

- Quality Control of Industrial Products

- Failure Analysis of Metals/Alloys

- Qualitative/Quantitative Analysis

 

Contact:

Mr. Benson Leung

Tel: +852 3411 5876

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About the Centre

Institute of Advanced Materials
Institute of Advanced Materials
Hong Kong Baptist University (HKBU)

This email address is being protected from spambots. You need JavaScript enabled to view it.
Cha Chi-ming Science Tower, Hong Kong Baptist University, Kowloon Tong , Hong Kong, China
3411 7014