Material Test

Centre for Electron Microscopy

CEM enables a wide variety of disciplinary and interdisciplinary research projects, covering topics from Optoelectronic to up-conversion, Ferroelectric to Pyroelectric, alloys to ceramics, polymers to biomaterials. CEM supports two transmission electron microscopes (JEOL-2011 & JEOL-2100F) providing bright field image, select area diffraction, annular dark field STEM, phase contrast high resolution electron microscopy, holography, electron energy loss spectroscopy, EDS. a dual beam focused ion beam (FIB) microscope (JIB-4501) with EBL-NPGS providing pattern writing and sample preparation, as well as an instrumentation for TEM sample preparation (PIPS-691).

 

Contact:

Dr. Wei Lu

Tel: +852 3400 2077

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About the Centre

University Research Facility in Materials Characterization and Device Fabrication
University Research Facility in Materials Characterization and Device Fabrication
The Hong Kong Polytechnic University (PolyU)

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Room HJ709, The Hong Kong Polytechnic University , Hung Hom, Kowloon , Hong Kong, China