Material Test

X-ray Diffraction (XRD)

X-ray Diffraction (XRD) is a powerful non-destructive technique for investigation of structural properties of crystalline materials. Diffraction pattern is produced by constructive interference of x-rays scattered at specific angles from each set of lattice planes in a sample. Consequently, the x-ray diffraction pattern is the fingerprint of periodic atomic arrangements in a given material. In addition to phase identification, it also provides information on texture, grain size, strain, phase purity etc.

Applications:

- Phase Determination – Powder / Thin Film

- In-Situ Investigation for Catalysts / Thin Film

- Thin Film Analysis: Roughness, Thickness, Density

- Quantitative Phase Analysis / Structure Refinement

 

Contact:

Ms Winnie Wu

Tel: +852 3411 7078

Email: This email address is being protected from spambots. You need JavaScript enabled to view it.

About the Centre

Institute of Advanced Materials
Institute of Advanced Materials
Hong Kong Baptist University (HKBU)

This email address is being protected from spambots. You need JavaScript enabled to view it.
Cha Chi-ming Science Tower, Hong Kong Baptist University, Kowloon Tong , Hong Kong, China
3411 7014