X-ray Diffraction (XRD)
X-ray Diffraction (XRD) is a powerful non-destructive technique for investigation of structural properties of crystalline materials. Diffraction pattern is produced by constructive interference of x-rays scattered at specific angles from each set of lattice planes in a sample. Consequently, the x-ray diffraction pattern is the fingerprint of periodic atomic arrangements in a given material. In addition to phase identification, it also provides information on texture, grain size, strain, phase purity etc.
- Phase Determination – Powder / Thin Film
- In-Situ Investigation for Catalysts / Thin Film
- Thin Film Analysis: Roughness, Thickness, Density
- Quantitative Phase Analysis / Structure Refinement
Ms Winnie Wu
Tel: +852 3411 7078