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Reliability Laboratory (RL)


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Unit G03, IC Development Centre, No. 6, Science Park West Avenue, Hong Kong Science Park, Shatin, New Territories , Hong Kong, China
2629 6683 / 2629 6600

The Reliability Laboratory is equipped with advanced reliability test equipment which supports product life simulation tests and stressed tests for IC / semiconductor devices.

Experienced engineers provide reliability tests and product qualification services for customers.  Our services range from Temperature-Electrical Characterization, IC Burn-In Test, Temperature Cycle Test to Temperature Humidity Bias Test on IC package level reliability tests.