Reliability Laboratory (RL)
The Reliability Laboratory is equipped with advanced reliability test equipment which supports product life simulation tests and stressed tests for IC / semiconductor devices.
Experienced engineers provide reliability tests and product qualification services for customers. Our services range from Temperature-Electrical Characterization, IC Burn-In Test, Temperature Cycle Test to Temperature Humidity Bias Test on IC package level reliability tests.
Testing Service Offered
- High Temperature Test
- Low Temperature Test
- Autoclave Test
- Highly Accelerated Stress Test (HAST)
- Temperature and Humidity Bias Test (THB)
- Temperature Cycle Test
- Thermal Shock Test - Air type
- High Temperature Operating Life (HTOL) Test
- Solder Reflow Simulation
- Moisture Sensitivity Level Test
Tel: +852 2629 6683 / 2629 6600
Address: Unit G03, IC Development Centre, No. 6, Science Park West Avenue, Hong Kong Science Park, Shatin, N.T., Hong Kong