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Reliability Laboratory (RL)


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Unit G03, IC Development Centre, No. 6, Science Park West Avenue, Hong Kong Science Park, Shatin, New Territories , Hong Kong, China
2629 6683 / 2629 6600

The Reliability Laboratory is equipped with advanced reliability test equipment which supports product life simulation tests and stressed tests for IC / semiconductor devices.

Experienced engineers provide reliability tests and product qualification services for customers.  Our services range from Temperature-Electrical Characterization, IC Burn-In Test, Temperature Cycle Test to Temperature Humidity Bias Test on IC package level reliability tests.

 

Testing Service Offered

- High Temperature Test

- Low Temperature Test

- Autoclave Test

- Highly Accelerated Stress Test (HAST)

- Temperature and Humidity Bias Test (THB)

- Temperature Cycle Test

- Thermal Shock Test  - Air type

- High Temperature Operating Life (HTOL) Test

- Solder Reflow Simulation

- Moisture Sensitivity Level Test

 

Contact:

Tel: +852 2629 6683 / 2629 6600

Email: pal@hkstp.org 

Address: Unit G03, IC Development Centre, No. 6, Science Park West Avenue, Hong Kong Science Park, Shatin, N.T., Hong Kong