Probe and Test Development Centre (PTDC)

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Hong Kong Science Park, Shatin, New Territories , Hong Kong, China

2629 6683 / 2629 6600

The Probe and Test Development Center provides test package development services, probe and test engineering services, to the semiconductor industry. It is equipped with sophisticated automatic test systems, wafer probers, IC handlers, tape and reel machine with scanner, thermosteam machine.

Probe and Test Equipment

Automated test equipment (ATE) supporting SoC, analog, mixed signal, RF and digital product testing is available.  Customers can hire the equipment on an hourly basis.

-  Advantest V93000 PS400 Tester RF option

-  Advantest V93000 PS800 Tester with AV-8 

-  Credence ASL1000 Analog Tester

-  Teradyne Integra J750 Digital Tester

-  HI Level ETS-780 Tester

-  Delta Edge Handler

-  Hontech Handler

-  ICOS TI-120 Scanner Machine with Tape and Reel option

-  Temptronic TP04310 ThermoStream system

Test/Product Engineering Support Service

By partnering with leading ATE suppliers and test houses, our experienced test engineers can help customers develop probe / final test packages, analyse the yield and perform electrical characterisation of IC products.  Engineering services will be carried out on a project basis.  Project fees vary depending on the project duration and device complexity.

Enquiry:

Probe and Test Development Centre

Tel: +852 2629 6600 / +852 2629 6683

Email: pal@hkstp.org

Address: Unit G03, G/F., IC Development Centre, No. 6, Science Park West Avenue, Hong Kong Science Park, Shatin, N.T., Hong Kong

Tel: +852 2629 6600 / +852 2629 6683