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IC Failure Analysis Laboratory (ICFAL)


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Unit 107-108A, 1/F, Biotech Centre 1, No. 9, Science Park West Avenue, Hong Kong Science Park, Shatin, New Territories , Hong Kong, China
2629 6683 / 2629 6600

The IC Failure Analysis Laboratory (ICFAL) is equipped with the comprehensive analytic equipment for non-destructive analysis, electrical analysis and physical analysis of semiconductor devices and electronic products.

Experienced engineers provide complete IC failure analysis and debugging.  

 

Testing Service Offered

-    Failure Mode Verification

-    Electrical Testing

-    External Package Inspection

-    Internal Package Inspection

-    De-capsulation

-    Defect Location

-    Layer De-processing

-    Optical Microscopy

-    Scanning Electron Microscopy

-    Circuit Editing

-    Structural Analysis

 

Enquiry

Tel: +852-2629 6683 / 2629 6600

Email: pal@hkstp.org

Address: Unit G03, G/F., IC Development Centre, No. 6, Science Park West Avenue, Hong Kong Science Park, Shatin, N.T., Hong Kong